New Atomic Force Microscope

- from Anfatec -

• Lateral resolution: < 5 nm (practical resolution limit under ambient pressure)
• Height resolution: < 0,2 nm (atomic steps and layers)
• Maximum scan range: 30 mm (standard, others possible on request)
• Maximum sample size: 4 cm x 4 cm
• Manual positioning range: 5 mm x 5 mm
• Accessories: 15 cantilevers; 1 calibration grating UMG01
• 20 sample holders; 2 sample boxes, tweezers
  

Level AFM	"Eddy" -- the Level AFM for educational purposes

 

New Features :

• Software-linearisation and calibration of the scanner
• Higher version of AMU 2.x with better signal to noise ratio for the detection of even smaller vibration amplitudes
  software type scanner linearisation
• 2nd trace image acquisition mode
• Improved observability of the sample in the camera, fine tread screws.
  
• 
  

  SPM Controller-PC Based	Vibration Isolation Table

  
  

Applications:

Atomic steps on a mica surface, Scan range: 5 µm. Sample: Courtesy of TU Chemnitz	Porous Alumina, Image range: 3 µm x 3 µm Dynamic NC Mode, Sample Courtesy of MPI Halle

NanoTech Scientific, Inc.
2 Robertson Road
Worcester MA 01602
www.nanotechscientific.com
support@nanotechscientific.com
phone: (508) 215-6793
fax: (508) 791-4674